Resumo

OTALORA, Diana María; OROZCO, Giovany  e  OLAYA-FLOREZ, Jhon Jairo. Microstructure and optical properties of bismuth and oxide bismuth films using unbalanced magnetron. Rev. acad. colomb. cienc. exact. fis. nat. [online]. 2015, vol.39, n.150, pp.18-25. ISSN 0370-3908.

Bismuth and bismuth oxide are materials of technological and theoretical interest because of their optical and electrical properties. Thin films of bismuth (Bi) and bismuth oxide (Bi₂O₃) on glass substrates were produced at room temperature using the unbalanced magnetron sputtering (UBM) technique. The microstructural characterization of samples was studied using x-ray diffraction (XRD) and confocal laser microscopy (CLM), while their elemental composition was analyzed with Auger electron spectroscopy (AES) and their optical properties with ultravioletvisible (UV/Vis) spectroscopy in the wavelength range of 500 - 1800 nm. XRD results showed that both materials have a polycrystalline character, with a rhombohedral structure for bismuth and phase for bismuth oxide. The energy band gap was 2.3 eV and 2.27 eV for bismuth and bismuth oxide, respectively.

Palavras-chave : Bismuth; microstructure; bismuth oxide optical properties; unbalanced magnetron sputtering.

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