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Revista Integración
Print version ISSN 0120-419X
Integración - UIS vol.35 no.1 Bucaramanga Jan./June 2017
https://doi.org/10.18273/revint.v35n1-2017001
Articulo Original
Puntos críticos y simetrías en problemas elípticos
Critical points and symmetries in elliptic problems
1Universidad del Valle, Departamento de Matemáticas, Cali, Colombia.
2Universidad Javeriana Cali, Departamento de Ciencias Naturales y Matemáticas, Cali, Colombia.
Se estima una cota superior para el número de puntos críticos de la solución de un problema semilineal elíptico con condición de Dirichlet nula en el borde de un dominio planar. El resultado se obtiene en dominios simétricos con respecto a una recta y convexos en la dirección ortogonal a la misma.
Palabras clave: Principio del máximo; puntos críticos; componentes conexas; simetría
In this paper we estimate an upper bound for the number of critical points of the solution to a semilinear elliptic problem with vanishing Dirichlet condition on a bounded planar domain. The result is obtained assuming that the domain is symmetric with respect to a line and convex in the orthogonal direction to the line of symmetry.
Keywords: Maximum principle; critical points; connected component; symmetry
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Recibido: Septiembre de 2016; Aprobado: Abril de 2017
Este es un artículo publicado en acceso abierto bajo una licencia Creative Commons
