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versão impressa ISSN 0012-7353


BONILLA-JAIMES, John Deiver et al. Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques. Dyna rev.fac.nac.minas [online]. 2016, vol.83, n.195, pp.84-92. ISSN 0012-7353.

By using the X-ray powder diffraction (XRPD) micro X-rays diffraction (mXRD) and scanning electron microscopy, the structural characterization of minerals is far more reliable and accurate. The identification and elemental and compositional quantification of minerals by these non-destructive techniques improve the quality of the results and allow a full analysis of the material. The data obtained by these techniques revealed the presence of garnet-type spessartine, in addition to trace elements and compounds that form the overall material. The structural refinement of spessartine was performed using the Rietveld method from data obtained by conventional diffraction and by using the MDI RIQAS analysis software. With the data acquired by mXRD using an area detector, a shorter exposure time (compared to that required by the 0L and 1D detectors) was achieved, and there was no need for particle size reduction of the mineral. It was also possible to identify the spessartine and other compounds in smaller concentrations (in situ measurements). By combining scanning electron microscopy and X-ray diffraction techniques, both worked from a characterization point of view. The examination by micro X-ray diffraction did not require physical separation of the sample. Using this information and the above advanced analytical techniques, the identification of garnet can be undertaken much more reliably.

Palavras-chave : scanning electron microscopy; micro X-ray diffraction; analytical techniques; mineral; garnet.

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