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Revista Integración
versión impresa ISSN 0120-419X
Resumen
ARANGO, Jaime; JIMENEZ, Juan y SALAZAR, Andrés. Critical points and symmetries in elliptic problems. Integración - UIS [online]. 2017, vol.35, n.1, pp.1-9. ISSN 0120-419X. https://doi.org/10.18273/revint.v35n1-2017001.
In this paper we estimate an upper bound for the number of critical points of the solution to a semilinear elliptic problem with vanishing Dirichlet condition on a bounded planar domain. The result is obtained assuming that the domain is symmetric with respect to a line and convex in the orthogonal direction to the line of symmetry.
Palabras clave : Maximum principle; critical points; connected component; symmetry.