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Ingeniería y Desarrollo

versión impresa ISSN 0122-3461versión On-line ISSN 2145-9371

Resumen

GOMEZ ACOSTA, LUIS GABRIEL; OROZCO HERNANDEZ, GIOVANY  y  QUINTERO BERNAL, DANIEL FERNANDO. Advanced chemical and structural characterization of RAM memory waste: an approach towards recyclahility and environmental safety. Ing. Desarro. [online]. 2025, vol.43, n.1, pp.84-103.  Epub 03-Ene-2025. ISSN 0122-3461.  https://doi.org/10.14482/inde.43.01.214.956.

This study addresses the chemical and structural characterization of powders derived from the grinding of RAM memory waste, focusing on the identification of their chemical composition (metallic and non-metallic elements). Using advanced techniques such as X-ray energy dispersive spectroscopy (EDS) and X-ray diffraction, a variety of metallic (Cu, Si, Sn) and non-metallic (fiberglass) elements and compounds essential in the manufacture of electronic circuit boards were detected. Furthermore, the concentrations of environmentally hazardous elements (Pb, As, Cd) and poly-chlorinated biphenyls were evaluated, finding that, for the most part, they are within the levels permitted by international regulations, suggesting that these wastes are relatively safe from an ecological perspective. However, levels of lead exceeding the established limits were observed, indicating the need for careful management. This work contributes to the knowledge about the composition of electronic waste and underscores the importance of developing effective and safe recycling processes to mitigate potential environmental risks.

Palabras clave : chemical characterization; electronic waste; recyclability and environmental safety.

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