SciELO - Scientific Electronic Library Online

 
vol.13 número2Quantum chaos in rectangular billiardElectronic band structure of the ordered Zn0.5Cd0.5Se alloy calculated by the semi-empirical tight-binding method considering second-nearest neighbor índice de autoresíndice de assuntospesquisa de artigos
Home Pagelista alfabética de periódicos  

Serviços Personalizados

Journal

Artigo

Indicadores

Links relacionados

  • Em processo de indexaçãoCitado por Google
  • Não possue artigos similaresSimilares em SciELO
  • Em processo de indexaçãoSimilares em Google

Compartilhar


Universitas Scientiarum

versão impressa ISSN 0122-7483

Resumo

RODRIGUEZ, Hernán  e  JIMENEZ, L. Camilo. Unit for monitoring and controlling the hall effect using labview®. Univ. Sci. [online]. 2008, vol.13, n.2, pp.188-197. ISSN 0122-7483.

We assembled a Hall effect and electric conductivity measuring unit that allows the determination of transport properties in semiconductor and metal films, including the type and concentration of majority carriers and their mobility, from measurements of Hall voltage and current. It is clear that electrons are the charge carrier in metals, however some metals such as aluminum, zinc and cadmium among others exhibit a behavior that, according to the classical view, should be positive charge carriers (holes). In this paper we discuss Hall effect measurements in two types of materials: copper (Cu) and zinc (Zn). Results from measurements show that copper has a negative Hall coefficient RH = - (0.28 ± 0.01)×10-10 m3/C and zinc has a positive coefficient RH = + (4.2 ± 0.2)×10-11 m3/C. Our results agree with those reported in the scientific literature. Most of the textbooks on solid state physics do not mention explicitly the reason why some metals show a positive Hall coefficient. We discuss this fact based on their band structures.

Palavras-chave : Hall effect; semiconductor; metal; LabVIEW.

        · resumo em Espanhol     · texto em Espanhol     · Espanhol ( pdf )

 

Creative Commons License Todo o conteúdo deste periódico, exceto onde está identificado, está licenciado sob uma Licença Creative Commons