Serviços Personalizados
Journal
Artigo
Indicadores
- Citado por SciELO
- Acessos
Links relacionados
- Citado por Google
- Similares em SciELO
- Similares em Google
Compartilhar
Universitas Scientiarum
versão impressa ISSN 0122-7483
Resumo
MESA, F; BALLESTEROS, V e DUSSAN, A. Calculation of the optical constants of Cu3BiS3 thin films using the Wolfe method. Univ. Sci. [online]. 2014, vol.19, n.2, pp.123-131. ISSN 0122-7483.
Using the Wolfe method, we calculated the procurement of optical constants. These constants, absorption coefficient (α), refraction index of (n) and thin film thickness (d ), are significant in the optical characterization of the material. We compared the Wolfe method with the method employed by R. Swanepoel. To estimate the optical constants of semiconductor thin films, we developed a constrained nonlinear programming model, based solely, on known transmission data. Ultimately, we presented a solution to this nonlinear programming model for quadratic programming. Through numerical experiments and transmittance spectral data of Cu3BiS3 thin films, we obtained values of a= 10378.34 cm-1, n = 2.4595, d =989.71 nm and Eg= 1.39 Ev, demonstrating the reliability of the proposed method.
Palavras-chave : Cu3BiS3 thin films; optical constants; Wolfe method.