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Revista de la Academia Colombiana de Ciencias Exactas, Físicas y Naturales
versión impresa ISSN 0370-3908
Resumen
OTALORA, Diana María; OROZCO, Giovany y OLAYA-FLOREZ, Jhon Jairo. Microstructure and optical properties of bismuth and oxide bismuth films using unbalanced magnetron. Rev. acad. colomb. cienc. exact. fis. nat. [online]. 2015, vol.39, n.150, pp.18-25. ISSN 0370-3908.
Bismuth and bismuth oxide are materials of technological and theoretical interest because of their optical and electrical properties. Thin films of bismuth (Bi) and bismuth oxide (Bi2O3) on glass substrates were produced at room temperature using the unbalanced magnetron sputtering (UBM) technique. The microstructural characterization of samples was studied using x-ray diffraction (XRD) and confocal laser microscopy (CLM), while their elemental composition was analyzed with Auger electron spectroscopy (AES) and their optical properties with ultravioletvisible (UV/Vis) spectroscopy in the wavelength range of 500 - 1800 nm. XRD results showed that both materials have a polycrystalline character, with a rhombohedral structure for bismuth and phase for bismuth oxide. The energy band gap was 2.3 eV and 2.27 eV for bismuth and bismuth oxide, respectively.
Palabras clave : Bismuth; microstructure; bismuth oxide optical properties; unbalanced magnetron sputtering.