Resumo

DUSSAN CUENCA, Anderon; QUIROZ GAITAN, Heiddy Paola  e  SENA GAIBAO, Neyder Jesús. IDENTIFICATION OF A NEW PHASE IN THE CRYSTAL STRUCTURE OF COMPOSITE QUATERNARY Cu₂ZnSnSe₄ STAGE DURING INCORPORATION OF ZnSe. Rev.EIA.Esc.Ing.Antioq [online]. 2014, n.spe1, pp.25-29. ISSN 1794-1237.

This work presents a study of the structural properties of thin films of the compound Cu₂ZnSnSe₄ varying both mass (M_X) and the substrate temperature which was evaporated (T_s) ZnSe binary compound. All samples were deposited by co-evaporation method in three phases keeping all other parameters constant. From measurements of x-ray diffraction it was possible to establish T_s increasing the presence of associated binary phase's quaternary compound during the growth process of the material. It was found that around the main peak, 2θ = 27,1°, predominantly binary phases and the presence of ZnSe which is formed during the subsequent step of selenization of the material. A sort of fork in the main peak (2θ = 27,1°) was observed for the transition between M_ZnSe = 0,153 g to 0,171 g. X-Ray diffraction measurements were made at binary compound pure, observing a correspondence with the peaks found around the main peak of the compound. A study by Raman spectroscopy, Raman shifts associated evidenced binary compounds observed by XRD. From the Scherrer equation it was found that crystallite sizes range between 80 and 90 nm.

Palavras-chave : Structural Proprieties; X-Ray; Quaternary Compounds; Propriedades estruturais; Raios X; Compostos quaternários.

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