Resumo

QUIROZ GAITAN, Heiddy Paola; LOPEZ OSPINA, Sandra Marcela; CALDERON COMBITA, Jorge Arturo  e  DUSSAN CUENCA, Anderon. SPECTRAL TRANSMITTANCE MEASUREMENTS WITHOUT THE PRESENCE OF INTERFERENCE FRINGES: A MODEL FOR OBTAINING OPTICAL CONSTANTS OF THIN SEMICONDUCTOR FILMS. Rev.EIA.Esc.Ing.Antioq [online]. 2014, n.spe1, pp.61-67. ISSN 1794-1237.

This paper presents a model for obtaining the optical constants of thin films semiconductors. It is possible when there are not interference fringes in the transmittance spectra. Optical constants as the absorption coefficient (α), refractive index (n), extinction coefficient (k) and other physical properties (Gap (Eg) and thickness (d)) were obtained for the Cu₂ZnSnSe₄ compound by deconvolution experimental spectra. Bhattacharyya model and basic elements of Swanepoel theory were used for analysis of transmittance measurements. TheModel presented takes into account considerations of inhomogeneity in the film and surface roughness. Values for the optical constants obtained by the proposed model showed agreement with those obtained for samples from Swanepoel theory, when its implementation was possible. A variation of ± 6 % for thickness values, which were corroborated by performing profilometry measurements, was observed.

Palavras-chave : Thin Films; Optics Properties; Semiconductors.

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