<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0121-750X</journal-id>
<journal-title><![CDATA[Ingeniería]]></journal-title>
<abbrev-journal-title><![CDATA[ing.]]></abbrev-journal-title>
<issn>0121-750X</issn>
<publisher>
<publisher-name><![CDATA[Universidad Distrital Francisco José de Caldas]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0121-750X2023000200200</article-id>
<article-id pub-id-type="doi">10.14483/23448393.18883</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Incertidumbre epistémica y aleatoria en soft metrología: una perspectiva desde el aseguramiento de la validez de los resultados]]></article-title>
<article-title xml:lang="en"><![CDATA[Aleatoric and Epistemic Uncertainty in Soft Metrology: A Perspective Based on Ensuring the Validity of Results]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Agudelo-Cardona]]></surname>
<given-names><![CDATA[Valentina]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Barbosa]]></surname>
<given-names><![CDATA[Íngrid Natalia]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Vallejo]]></surname>
<given-names><![CDATA[Marcela]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Bahamón-Cortés]]></surname>
<given-names><![CDATA[Nelson]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Delgado-Trejos]]></surname>
<given-names><![CDATA[Edilson]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Instituto Tecnológico Metropolitano (ITM)  ]]></institution>
<addr-line><![CDATA[Medellín ]]></addr-line>
<country>Colombia</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Instituto Tecnológico Metropolitano  ]]></institution>
<addr-line><![CDATA[Medellín ]]></addr-line>
<country>Colombia</country>
</aff>
<aff id="Af3">
<institution><![CDATA[,Instituto Tecnológico Metropolitano  ]]></institution>
<addr-line><![CDATA[Medellín ]]></addr-line>
<country>Colombia</country>
</aff>
<aff id="Af4">
<institution><![CDATA[,Instituto Nacional de Metrología de Colombia  ]]></institution>
<addr-line><![CDATA[Bogotá ]]></addr-line>
<country>Colombia</country>
</aff>
<aff id="Af5">
<institution><![CDATA[,Instituto Tecnológico Metropolitano  ]]></institution>
<addr-line><![CDATA[Medellín ]]></addr-line>
<country>Colombia</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>08</month>
<year>2023</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>08</month>
<year>2023</year>
</pub-date>
<volume>28</volume>
<numero>2</numero>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.co/scielo.php?script=sci_arttext&amp;pid=S0121-750X2023000200200&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.co/scielo.php?script=sci_abstract&amp;pid=S0121-750X2023000200200&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.co/scielo.php?script=sci_pdf&amp;pid=S0121-750X2023000200200&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen  Contexto:  En ingeniería, el modelado para el análisis de riesgo y confiabilidad de los procesos de medición que incluyen rutinas de cómputo exige el análisis de las fuentes y categorías de la incertidumbre, la cual, en este contexto, puede ser clasificada como aleatoria y epistémica.  Método:  Se presenta una revisión de la literatura obtenida de bases de datos como Google Scholar, IEEEXplore y ScienceDirect en cuanto a tendencias y enfoques relacionados con el concepto de incertidumbre, en el marco de la soft metrología, a fin de mejorar la comprensión cuando se tienen restricciones adicionales debido al aseguramiento de la validez de los resultados.  Resultados:  Se exponen conceptos y comparaciones que ayudan a mejorar la comprensión de la incertidumbre epistémica y aleatoria en los procesos de medición de soft metrología y su relación con el aseguramiento de la validez de los resultados, en el marco de las máquinas de aprendizaje.  Conclusiones:  Se concluye que la calidad en la representación de los sistemas de soft metrología es influenciada de manera constante por la incertidumbre aleatoria, y la incertidumbre epistémica exhibe una dinámica descendente cuanto mejor sea el ajuste del modelo con suficientes datos de entrenamiento.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract  Context:  In engineering, modeling for risk analysis and ensuring the validity of results in systems that include computational routines requires the analysis of the sources and categories of uncertainty, which, in this context, can be classified as aleatoric and epistemic.  Method:  A literature review from databases such as Google Scholar, IEEEXplore, and ScienceDirect is presented herein, analyzing trends and approaches related to the concept of uncertainty within the framework of soft metrology, in order to improve our understanding when there are additional restrictions due to the assurance of the validity of the results.  Results:  This paper presents concepts and comparisons that aid in the understanding of epistemic and random uncertainty in soft metrology measurement processes and the way in which it is related to the assurance of the validity of results within the framework of learning machines.  Conclusions:  Representation quality in soft metrology systems is constantly influenced by random uncertainty, while epistemic uncertainty exhibits descending dynamics when the fit of the model improves with sufficient training data.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[soft metrología]]></kwd>
<kwd lng="es"><![CDATA[incertidumbre epistémica]]></kwd>
<kwd lng="es"><![CDATA[incertidumbre aleatoria]]></kwd>
<kwd lng="es"><![CDATA[máquinas de aprendizaje.]]></kwd>
<kwd lng="en"><![CDATA[soft metrology]]></kwd>
<kwd lng="en"><![CDATA[epistemic uncertainty]]></kwd>
<kwd lng="en"><![CDATA[random uncertainty]]></kwd>
<kwd lng="en"><![CDATA[learning machines]]></kwd>
</kwd-group>
</article-meta>
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